Dongguan Chuangrui New Energy Co., Ltd
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ATE charger adapter test system Power integrated automated test system factory direct sales
Open
• An open hardware platform that allows for the addition or removal of various testing devices according to customer needs (including devices with GPIB, RS-232, USB interfaces, etc.)
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity.
• An open software platform, the ATE power supply testing system can be expanded with new test items and functions based on customer testing requirements.
• The ATE power supply testing system supports simultaneous multi-lane barcode pre-scanning and scanning during testing, enhancing overall testing speed.
Universal
• The ATE power supply testing system supports testing of various power supplies (LED power supplies, adapters/chargers, PC power supplies, inverters, communication power supplies, etc.)
• Complies with ENERGY STAR and IEC 62301 measurement requirements.
• Supports Manufacturing Information System (ShopFloor) interface.
• The ATE power supply testing system supports testing of various power parameters under CV, CC, CR, LED modes.
• Optimizes display mode, allowing for any combination of hardware configurations.
Professional
• The ATE power supply testing system supports complete testing of LED driver power supplies.
• Can accurately read the average current and effective current of the tested LED driver.
• Easily starts low-power LED driver power supplies without pulling down the LED driver due to the high current surge from starting the electronic load.
• The ATE power supply testing system sets realistic LED on-threshold values and post-on operating point resistance through system settings, making the tested current and voltage waveforms very close to real LEDs.
• More realistic high-frequency current waveforms.
• Dimming function test: dimming current, dimming frequency, dimming period (requires additional related hardware devices).
Top-Smart 2000 ATE Power Supply Testing System Test Items:
| Test items | Comprehensive Test items |
| CEC test | Short circuit test |
| DC Current under C.V.Mode | Short circuit current |
| Peak-Peak noise | OV protection |
| Serial reaction time test | UV protection |
| Transient response time | OL protection |
| Transient spike | OP protection |
| Tracking | In-test adjustment test |
| Voltage regulation | AC cycle drop out |
| Current regulation | PLD simulation |
| Turn ON time | DC output current test |
| Rise time | DC output voltage test |
| Fall time | Waveform read test |
| Hold-up time | Input impulse current test |
| Inrush current test | Input power |
| Power good signal | Relay control |
| Power fail signal | Bar code scan |
| P/S ON signal | Dynamic test |
| Power up sequence | Specification under C.P.Mode |
| Power off sequence | Input Peak current |
| Effciency test | Additional expansion measurement test |
| Overall stability test | Input RMS current |
| Fan Speed test | TTL signal control |
| Input power factor | LAN read/write |
| Input voltage ramp | RS485 read/write |
| Input freq. ramp | USB read/write |
| Extend the measurement test | 232 read/write |
| Automatic test | GPIB read/write |
