Dongguan Chuangrui New Energy Co., Ltd
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Test equipment Industrial Power Supply Testing System, LED Driver Power Supply Testing System, Portable Charger Testing System.
Industrial power supply testing systems also boast excellent compatibility and openness. The open hardware and software platforms allow enterprises to customize testing solutions according to their specific needs, integrating various testing devices and interfaces. This compatibility not only enhances the system's practicality but also saves costs for businesses.
With their high efficiency, accuracy, flexibility, statistical analysis capabilities, and excellent compatibility, industrial power supply testing systems play an irreplaceable role in modern manufacturing. As technology continues to advance, these systems will keep driving the development of the manufacturing industry, creating greater value for businesses.
Features of the Top-Smart 2000 ATE Power Supply Testing System:
Open
• An open hardware platform that allows for the addition or removal of various testing devices according to customer needs (including devices with GPIB, RS-232, USB interfaces, etc.)
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity.
• An open software platform, the ATE power supply testing system can be expanded with new test items and functions based on customer testing requirements.
• The ATE power supply testing system supports simultaneous multi-lane barcode pre-scanning and scanning during testing, enhancing overall testing speed.
Universal
• The ATE power supply testing system supports testing of various power supplies (LED power supplies, adapters/chargers, PC power supplies, inverters, communication power supplies, etc.)
• Complies with ENERGY STAR and IEC 62301 measurement requirements.
• Supports Manufacturing Information System (ShopFloor) interface.
• The ATE power supply testing system supports testing of various power parameters under CV, CC, CR, LED modes.
• Optimizes display mode, allowing for any combination of hardware configurations.
High-Speed
• The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity. (The testing speed for LED power supplies/adapters/chargers is more than double that of the widely used 6000 series power automatic systems.)
• Conducts parallel barcode scanning during testing, greatly improving testing speed.
Professional
• The ATE power supply testing system supports complete testing of LED driver power supplies.
• Can accurately read the average current and effective current of the tested LED driver.
• Easily starts low-power LED driver power supplies without pulling down the LED driver due to the high current surge from starting the electronic load.
• The ATE power supply testing system sets realistic LED on-threshold values and post-on operating point resistance through system settings, making the tested current and voltage waveforms very close to real LEDs.
• More realistic high-frequency current waveforms.
• Dimming function test: dimming current, dimming frequency, dimming period (requires additional related hardware devices).
Top-Smart 2000 ATE Power Supply Testing System Test Items:
| Test items | Comprehensive Test items |
| CEC test | Short circuit test |
| DC Current under C.V.Mode | Short circuit current |
| Peak-Peak noise | OV protection |
| Serial reaction time test | UV protection |
| Transient response time | OL protection |
| Transient spike | OP protection |
| Tracking | In-test adjustment test |
| Voltage regulation | AC cycle drop out |
| Current regulation | PLD simulation |
| Turn ON time | DC output current test |
| Rise time | DC output voltage test |
| Fall time | Waveform read test |
| Hold-up time | Input impulse current test |
| Inrush current test | Input power |
| Power good signal | Relay control |
| Power fail signal | Bar code scan |
| P/S ON signal | Dynamic test |
| Power up sequence | Specification under C.P.Mode |
| Power off sequence | Input Peak current |
| Effciency test | Additional expansion measurement test |
| Overall stability test | Input RMS current |
| Fan Speed test | TTL signal control |
| Input power factor | LAN read/write |
| Input voltage ramp | RS485 read/write |
| Input freq. ramp | USB read/write |
| Extend the measurement test | 232 read/write |
| Automatic test | GPIB read/write |
