Dongguan Chuangrui New Energy Co., Ltd
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Production of ATE Power Supply Automatic Testing Systems, Switching Power Supply Testing Systems, LED Power Supply Testing Systems.
Features of the Switching Power Supply Automatic Testing System TopFer 6600:
• High Efficiency
The system adopts a synchronous parallel testing architecture, which is approximately 3-4 times faster than traditional ATS systems.
• Strong System Stability
Components such as AC Source and electronic loads exhibit excellent stability and reliability.
• High Accuracy
DC, 14-BIT, 100% analog simulation of various inputs, with an accuracy of 0.02% + 0.02% F.
• Extensibility
Through 10 sets of Extended Measurement, the switching power supply automatic testing system can measure internal AC and DC voltage simulations on PCBs.
• Statistical Analysis Capability
Comprehensive analysis of test results and generation of analytical charts, providing real-time process deviation warnings.
Advantages of the TopFer 6600 Switching Power Supply Automatic Testing System:
• Suitable for testing applications of AC/DC Power Supplies and DC/DC Converters.
• High extensibility, easily integrating standardized interface testers.
• Fast testing speed, 3-4 times faster than traditional ATS systems.
• Open system platform, allowing for self-edited test steps according to requirements.
• Standardized instrument control interface and graphical operating environment (Windows interface).
• The TopFer 6600 switching power supply ATE provides report design and statistical analysis capabilities.
Test Items for the Switching Power Supply Testing System :
| Test items | Test items |
| Measuring under LED.Mode | Tracking |
| DC Current under C.V.Mode | Short circuit test |
| Peak-Peak noise | Short circuit current |
| Current peak-Peak noise | OV protection |
| Voltage peak-Peak noise | UV protection |
| Transient response time | OL protection |
| Transient spike | OP protection |
| Voltage regulation | In-test adjustment |
| Current regulation | AC cycle drop out |
| Turn ON time | PLD simulation |
| Rise time | GPIB read/write |
| Fall time | 232 read/write |
| Hold-up time | USB read/write |
| Inrush current test | TTL signal control |
| Power good signal | Relay control |
| Power fail signal | Bar code scan |
| P/S ON signal | Dynamic test |
| Power up sequence | Specification under C.P.Mode |
| Power off sequence | DC output current |
| Effciency | DC output voltage |
| Input RMS current | Current Ripple test |
| Input power | Dimming Current |
| Input power factor | Dimming frequency |
| Input voltage ramp | Dimming period |
| Input freq. ramp |
